Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2005-04-12
2005-04-12
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
For optical fiber or waveguide inspection
Reexamination Certificate
active
06879387
ABSTRACT:
The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.
REFERENCES:
patent: 5864400 (1999-01-01), Bottazzi et al.
patent: 6580498 (2003-06-01), Harley
Agilent Technologie,s Inc.
Nguyen Tu T.
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