Polarization analyzing apparatus and method for polarization...

Details Polarization analyzing apparatus and method for polarization... Polarization analyzing apparatus and method for polarization...

2005-01-25

2005-01-25

Lauchman, Layla G. (Department: 2877)

Optics: measuring and testing

By polarized light examination

C356S365000, C356S366000, C356S369000

Reexamination Certificate

active

06847448

ABSTRACT:
A polarization analyzing apparatus includes: a light source for generating optical pulses; a light dividing part; an electromagnetic wave radiation part; a collimation part; a polarizer part; a light analyzer part; a condenser part; an optical time-delay part; an electromagnetic wave detector part; and a calculation part which Fourier-transforms time-resolved waveforms obtained by time-resolving electrical signals of s- and p-polarized electromagnetic waves reflected from a sample, and calculates amplitude and phase information of the s- and p-polarized electromagnetic waves.

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patent: 6661519 (2003-12-01), Fukasawa
patent: 20020067480 (2002-06-01), Takahashi
patent: 20030165003 (2003-09-01), Ciesla et al.
patent: 10142060 (1998-05-01), None
patent: 2001141567 (2001-05-01), None
patent: 2001151916 (2001-06-01), None

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