Polarization analyzer

Details Polarization analyzer Polarization analyzer

2007-09-04

2007-09-04

Nguyen, Tu T. (Department: 2886)

Optics: measuring and testing

By polarized light examination

Reexamination Certificate

active

10537314

ABSTRACT:
A thin polarizer array and a wavelength plate array that are composed of micro regions having different optical axis directions and wavelength characteristics and having a high extinction ratio and a low insertion loss, and a polarization analyzer using them. An array of micro periodic grooves is formed on a substrate, with the directions changed from one region to another. An alternating multilayer film formed by bias sputtering alternating a layer of high refractive index material such as Si or Ta2O5and a layer of low refractive index material such as SiO2. By selecting a condition that each layer maintains its periodic projecting/recessed shape, an array of photonic crystal polarizer is formed. By mounting this array of photonic crystal polarizer in a photodetector array, a polarization analyzer that is small, has no movable part, has a small number of components, and enables high-precision measurement is constituted.

REFERENCES:
patent: 4902112 (1990-02-01), Lowe
patent: 1 103 829 (2001-05-01), None

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