Optics: measuring and testing – By polarized light examination
Patent
1988-01-25
1995-03-07
Buczinski, Stephen C.
Optics: measuring and testing
By polarized light examination
250225, 356367, G01J 400, G02F 101
Patent
active
053963296
ABSTRACT:
Known polarization image detection systems produce an image illustrating structural information of a viewed scene which is representative of the degree of linear polarization. The present invention describes an improved detector system which enables more information to be extracted from the scene. The system comprises an optical arrangement having an optical axis (4) about which a retarder (1) and a linear polarizer (2) can be independently rotated, for producing a focussed image on a detector. This arrangement can be expressed mathematically in terms of Stokes parameters and Mueller matrices, and the expression can then be solved to provide three different polarization images representative of the viewed scene.
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patent: 4523848 (1985-06-01), Gorman et al.
patent: 4624563 (1986-11-01), Johnson
patent: 4626100 (1986-12-01), Johnson
British Aerospace PLC
Buczinski Stephen C.
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