Polarimetry of three-dimensional optical fields

Details Polarimetry of three-dimensional optical fields Polarimetry of three-dimensional optical fields

2007-12-18

2007-12-18

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

By polarized light examination

Reexamination Certificate

active

11417800

ABSTRACT:
The apparatus, system and method of the present invention provide a three-dimensional polarimeter probe having a coupler for coupling three components of an electromagnetic field that fluctuates in three-dimensions and an emitter for re-emitting a radiation corresponding to said three components. The radiation includes a polarized and an unpolarized component of said electromagnetic field and is used to determine the elements of a field-field correlation martix. In an embodiment, the system includes a detector located a distance from said probe for sensing said re-emitted radiation from said probe and a processor for determining a polarized and an unpolarized component of said electromagnetic field evaluating the polarized component to produce said polarimetry of said three-dimensional optical field.

REFERENCES:
patent: 2004/0114235 (2004-06-01), Sedlmayr
J. Ellis, A. Dogariu, S. Ponomarenko, and E. Wolf, “Degree of Polarization of Statistically Stationary Electromagnetic Fields”, Science Direct, Optics Communications, vol. 248, pp. 333-337 (Apr. 2005).
J. Ellis and A. Dogariu, “On the degree of polarization of random electromagnetic fields”, Science Direct, Optics Communications, vol. 253, (Sep. 15, 2005) pp. 257-265.
J. Ellis, and A Dogariu, “Optical Polarimetry of Random Fields,” Physical Review Letters; vol. 95, The American Physical Society, Nov. 11, 2005.
J. Ellis, and Dogariu, “Correlation Matrix of a Completely Polarized, Statistically Stationary Electromagnetic Field,” Optics Letters, vol. 29, No. 13, Jul. 1, 2004.
R. Dandliker, et al. “Measuring three-dimensional polarization with scanning optical probes”, J. Opt. A: Pure Appl. Opt. 6, S18 (2004) abstract, [online] Journal of Optics A: Pure and Applied Optics, 1 page, [retrieved on May 4, 2006] Retrieved from: http://www.iop.org/EJ/abstract/1464-4258/6/6/003.

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