Polarimetric Raman system and method for analysing a sample

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering

Reexamination Certificate

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C356S369000

Reexamination Certificate

active

07859661

ABSTRACT:
A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman scattered light to form a Raman scattered light beam, a detection system measuring intensity of the Raman scattered light beam as a function of time. The system includes at least a polarization state generator able to generate four independent polarization states or a polarization state analyzer able to analyze four independent polarization states to detect the intensity of the Raman scattered light beam and calculate a partial or complete Mueller-Stokes matrix of the sample.

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patent: 2006/029604 (2006-03-01), None
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Loechelt et al., “Polarized Off-axis Raman Spectroscopy: A Technique for measuring stress tensors in semiconductors,” J. of Appl. Phys., vol. 86, No. 11, pp. 6164-6180 (Dec. 1, 1999).
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Garcia-Caurel et al., “Spectroscopic Mueller polarimeter based on liquid crystal devices,” Thin Solid Films, vol. 455-456, pp. 120-123 (May 1, 2004).
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