Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1979-03-26
1981-12-22
Punter, William H.
Optics: measuring and testing
By polarized light examination
With polariscopes
350377, 350393, 350403, 350407, 356365, 356369, G01N 2121, G01U 404, G02F 101, G02F 109
Patent
active
043068090
ABSTRACT:
To measure characteristics such as density and particle-size distributions of a medium that interacts with light, a polarimeter simultaneously develops all 16 elements of the Mueller matrix by modulating polarized monochromatic light with a quarter-wave retarder operating at a predetermined frequency before transmitting it to the medium and then modulating the light leaving the medium with another quarter-wave retarder which operates at a frequency five times that of the predetermined frequency of modulation of the light transmitted to the medium. The light is electrically detected and provides a signal which may, by Fourier analysis, be broken into 25 terms. The coefficients of those 25 terms, by relatively easy calculations, provide the 16 elements of the Mueller matrix. An electrical element is provided for optically simulating the rotation of a quarter-wave retarder.
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patent: 3985447 (1976-10-01), Aspnes
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Azzam, R. M. A., "Photopolarimetric Measurement of the Mueller Matrix by Fourier Analysis of a Single Detected Signal", Optics Letters, 6-1978, pp. 148-150.
Thompson et al., "Polarization-Dependent Ligh-Scattering Measurements Using an Electro-Optical Modulator-Based Instrument" Optical Polarimetry, vol. 112 1977, pp. 152-157.
Azzam, R. M. A. "Simulation of Mechanical Rotation by Optical Rotation: Application to the Design of a NE Photopolarimeter", J. Opt. Soc. A. vol. 68, 4-1978, pp. 518-521.
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Carney Vincent L.
Punter William H.
The Board of Regents of the University of Nebraska
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