Image analysis – Pattern recognition – Feature extraction
Patent
1998-12-23
2000-11-21
Tran, Phuoc
Image analysis
Pattern recognition
Feature extraction
382181, 382201, 382295, 345418, 345438, 345441, 345442, 348580, G06K 900, G06K 946, G06T 1120, G06T 320, H04N 974
Patent
active
06151411&
ABSTRACT:
In a point symmetry shaping apparatus used for a curved figure, any unrecorded symmetry figures are automatically shaped in a point symmetry manner within a short processing time. In the point symmetry shaping apparatus, a coordinate point which constitutes a symmetry center candidate point is calculated from all of center points of symmetry-judging-line-segments. A first point symmetry center candidate point/center point distance calculating unit calculates a distance between the symmetry center candidate point and the center point of the symmetry-judging-line-segment. A point symmetry judging unit judges a point symmetry of the input curved figure in such a manner that a calculation is made of a fluctuation value contained in the distances between the symmetry center candidate point and the center points of the symmetry-judging-line-segments, and the calculated fluctuation value is compared with a threshold value. A point symmetrizing processing unit corrects the coordinate values of the set of the intersection points between the curved line of the input curved figure and the grid, and also the coordinate values of the feature points in order to shape such an input curved figure having a point symmetry judged by the point symmetry judging unit in such a manner that the input curved figure having the point symmetry is positioned in a point symmetry manner with respect to the point symmetry center candidate point.
REFERENCES:
patent: 4797842 (1989-01-01), Nackman et al.
patent: 4933865 (1990-06-01), Yamamoto et al.
patent: 5426729 (1995-06-01), Parker
Mariam Daniel G.
NEC Corporation
Tran Phuoc
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