Point source module and methods of aligning and using the same

Details Point source module and methods of aligning and using the same Point source module and methods of aligning and using the same

2005-08-02

2005-08-02

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

C356S508000

Reexamination Certificate

active

06924897

ABSTRACT:
A point source module is provided, comprising: a Shack cube comprising a beam splitter cube with an attached spherical reference surface defining a reference arm; a test arm that is associated with transmission of optical radiation from a source to a sample; a point source of optical radiation whose emissions traverse both the reference arm and the test arm; and a detector associated with a surface of the beam splitter cube and receiving optical radiation from both the reference arm and the test arm and comprising a detector arm, an objective lens associated with the test arm, or both. Further, a method of aligning the point source module is provided, along with a method of using the point source microscope is provided. The apparatus and methods provide a compact, robust device and technique for measuring or locating optical or mechanical datum of parts that are being manufactured or assembled.

REFERENCES:
patent: 6459490 (2002-10-01), Kuhn et al.
patent: 6738147 (2004-05-01), Yafuso
Application of a Shack cube as a beam splitter in interferometers with a local reference beam, Shen et al, Applied Optics, Dec. 1996, pp 6648-6654.
W.T. Welford, “Optical Shop Testing”, Daniel Malacara, editor, 2ndedition, John Wiley & Sons, pp. 397-398 (1992).
J. Ojeda-Castañeda, “Optical Shop Testing”, Daniel Malacara, editor, 2ndedition, John Wiley & Sons, pp. 265-270 (1992).
R.E. Parks, “Bright, inexpensive pinhole source”, Applied Optics, vol. 17, No. 16, p. 2469 (1978).
M.V. Mantravadi, “Newton, Fizeau, and Haidinger Interferometers”, Optical Shop Testing, 2ndEd, John Wiley & Sons, Inc., pp. 34-35 (1992).

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