Point diffraction interferometer with enhanced contrast

Details Point diffraction interferometer with enhanced contrast Point diffraction interferometer with enhanced contrast

2006-08-22

2006-08-22

Pham, Hoa Q. (Department: 2877)

Optics: measuring and testing

By light interference

Having wavefront division

C356S515000

Reexamination Certificate

active

07095510

ABSTRACT:
The interferometer has a diffraction grating21, a condenser lens22, a transparent substrate23, a field lens24and an imaging device25arranged in this order. The transparent substrate23is arranged at the position in the optical axis direction where both focal spots of a zeroth-order diffracted light L21and a first-order diffracted light L22are formed. Formed on the transparent substrate23is a circular opaque zone23awhose central position is the central position of the focal spot of the first-order diffracted light L22. Formed at the center of the opaque zone23ais a pinhole23bwhose central position is the central position of the focal spot of the first-order diffracted light L22. The contrast of the interference fringes observed on the image device25is enhanced by the optical interference between the first-order diffracted light L22passing through the pinhole23band the zeroth-order diffracted light L21passing through the transparent substrate23.

REFERENCES:
patent: 6266147 (2001-07-01), Naulleau
patent: 57-64139 (1982-04-01), None
patent: 08-297009 (1996-11-01), None

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