Point-diffraction interferometer utilizing separate reference an

Details Point-diffraction interferometer utilizing separate reference an Point-diffraction interferometer utilizing separate reference an

1994-06-10

1995-10-10

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, 356359, G01B 902

Patent

active

054575338

ABSTRACT:
A split-path point-diffraction interferometer (SPPDI) comprising separate signal and reference beam paths is disclosed. A beamsplitter is used to divide a linearly polarized converging incident signal beam into separate signal and reference beam paths prior to focus. The reference beam path comprises a diffracting aperture located at the focal point of the signal beam. The diffracting aperture in the reference beam path produces an expanding, diffraction-limited reference wavefront. The signal and reference beam paths comprise linear polarizers whose yaw, pitch, and roll orientation may be freely adjusted. Yaw and pitch adjustment of one or more linear polarizers provides for adjustment of fringe spacing and orientation. Roll adjustment of one or more linear polarizers provides for adjustment of fringe contrast and intensity. Beam turning mirrors are used to direct the signal and reference beams to a beam combiner. Polarizing analysers are placed in the combined output beams produced by the beam combiner. A double-pass embodiment of an SPPDI comprising a beam splitter and compact laser source is disclosed.

REFERENCES:
patent: 4744658 (1988-05-01), Holly
patent: 5239364 (1993-08-01), Matsuzaki
R. N. Smartt and J. Strong: J. Opt. Soc. Amer. vol. 62 (1973) p. 737.
R. N. Smartt and W. H. Steel: Japanese Journal of Applied Physics, vol. 14 (1975) Suppl. 14-1, pp. 351-356.
C. Koliopoulos et al.: Optics Letters, vol. 3, Sep. 1978, pp. 118-120.
R. N. Smartt: Interferometry, G. W. Hopkins ed., Proc. SPIE, vol. 192 (1979), pp. 35-40.

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