POGO pin and test socket including the same

Details POGO pin and test socket including the same POGO pin and test socket including the same

2007-07-17

2007-07-17

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S755090

Reexamination Certificate

active

11325145

ABSTRACT:
A POGO pin that can measure low frequency products as well as RF products and also have a long life span, and a test socket including the POGO pin are provided. The POGO pin includes a metal plunger formed of a conductive metal so as to electrically contact the semiconductor package, and a rubber contact pin connected with the metal plunger and formed of a conductive rubber so as to electrically contact the test board.

REFERENCES:
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patent: 6204680 (2001-03-01), Swart et al.
patent: 6380755 (2002-04-01), Sato
patent: 6486690 (2002-11-01), Takagi et al.
patent: 6524115 (2003-02-01), Gates et al.
patent: 6574114 (2003-06-01), Brindle et al.
patent: 2004/0211061 (2004-10-01), Farnworth
patent: 2003-084047 (2003-03-01), None
patent: 2001-111118 (2001-12-01), None
patent: 2003-010423 (2003-02-01), None
patent: 2003-0091216 (2003-12-01), None
patent: 20-0322060 (2006-08-01), None
patent: 2004/086565 (2004-10-01), None
English language abstract of Korean Publication No. 2001-111118.
English language abstract of Korean Publication No. 2003-010423.
English language abstract of Japanese Publication No. 2003-084047.

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