Plural probe circuit card fixture using a vacuum collapsed membr

Details Plural probe circuit card fixture using a vacuum collapsed membr Plural probe circuit card fixture using a vacuum collapsed membr

1976-11-01

1979-08-14

Corcoran, Robert J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 725, 324158F, 324158P, G01R 1512, G01R 3102

Patent

active

041647041

ABSTRACT:
A test fixture for circuit cards comprising a probe board bearing electrical test probes in a fixed position with respect to the overlying test surface. A flexible sheet is supported by the probes and serves to stabilize their relative positions. The circuit card is held against the probes by vacuum force applied utilizing a thin plastic layer overlying the circuit card. The test probe utilized in the test fixture has a conductive shaft tapering to a cylindrical tip on which a conductive spring and a conductive contact cap are slidably mountable. The cap is tapered down to the tip, and the spring is designed to engage both the tapered portions of the cap and of the shaft. A twisting motion of the cap causes the spring to electrically and physically connect the cap and the shaft. The cap also an indentation for interlocking with the flexible sheet of the test fixture.

REFERENCES:
patent: 2916723 (1959-12-01), Cronin
patent: 3416125 (1968-12-01), Theve
patent: 3437984 (1969-04-01), Yorgensen
patent: 3654585 (1972-04-01), Wickersham
patent: 3723867 (1973-03-01), Canarutto
patent: 3757219 (1973-09-01), Aksu
patent: 3996516 (1976-12-01), Luther
patent: 4017793 (1977-04-01), Haines
Till, A. W.; Contact Probe-IBM Tech. Bull., vol. 16, No. 10, Mar. 1974, pp. 3224-3225.

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