Plural light source and camera to detect surface flaws

Details Plural light source and camera to detect surface flaws Plural light source and camera to detect surface flaws

2007-02-09

2010-02-16

Toatley, Jr., Gregory J (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C356S600000, C356S612000

Reexamination Certificate

active

07663745

ABSTRACT:
A method for detecting specular surface flaws on a coated substrate includes impinging visible non-integrated electromagnetic radiation from a first source onto the coated substrate, reflecting the visible non-integrated electromagnetic radiation off the coated substrate into a first photosensitive device, forming a recorded high frequency surface flaw image, and impinging visible coherent electromagnetic radiation from a second source onto a coated substrate at an oblique angle. The visible non-integrated electromagnetic radiation and the visible coherent electromagnetic radiation on the coated substrate are collocated but not combined on the substrate. The visible coherent electromagnetic radiation is reflected off the coated substrate onto a screen material to form a low frequency surface flaw image. The low frequency surface flaw image is recorded to form a recorded low frequency surface flaw image.

REFERENCES:
patent: 4794264 (1988-12-01), Quackenbos et al.
patent: 4794265 (1988-12-01), Quackenbos et al.
patent: 5225890 (1993-07-01), Lee et al.
patent: 6100990 (2000-08-01), Ladewski
patent: 6157450 (2000-12-01), Marchese-Ragona et al.
patent: 7099002 (2006-08-01), Ishiura et al.

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