PLT/PZT ferroelectric structure

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C257S516000, C257S310000, C257S295000, C438S003000

Reexamination Certificate

active

11002383

ABSTRACT:
An electrically stable PbLa0.5TiO3/PbZr0.52Ti0.48O3(PLT/PZT) ferroelectric structure may fabricated using precursor solutions formed using a simple sol-gel process. The PLT/PZT ferroelectric structure may be extended to a PLT/PZT/PLT ferroelectric capacitor structure. In terms of device application, better ferroelectric properties with reliable fatigue characteristics are desirable to render satisfactory performance and long device life. The PLT/PZT/PLT ferroelectric capacitor structure excels over previous hybrid structures by providing a larger remnant polarization, higher saturation polarization, lower coercive field and leakage current density and higher resistance to fatigue. The fabrication method involving the use of a PLT seeding layer acts to lower the fabrication temperature of the subsequent PZT layer and allows for a simpler sequence of processing steps that may be seen to substantially reduce manufacturing costs.

REFERENCES:
patent: 5612560 (1997-03-01), Chivukula et al.
patent: 5998236 (1999-12-01), Roeder et al.
patent: 6903491 (2005-06-01), Irie et al.
patent: 6969157 (2005-11-01), Tomozawa et al.
patent: 2002/0063271 (2002-05-01), Kim
patent: 2004/0155272 (2004-08-01), Shin et al.
patent: 2004/0195603 (2004-10-01), Ito
Dey et al. “Advances in Processing and Properties of Perovskite Thin-Films for FRAMs, DRAMs, and Decoupling Capacitors”, Integrated Ferroelectrics, 1992, vol. 1.
Patel et al. “Ferroelectric Thin Films for Integrated Sensor and Memory Devices”, GEC Journal of Research, vol. 12, No. 3, 1995.
Nakao et al. “Study on Pb-Based Ferroelectric Thin Films Prepared by Sol-Gel Mehtod for Memory Application”, Jpn. J. Appl. Phys., vol. 33, 1994.

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