PLL semiconductor device with testability, and method and...

Details PLL semiconductor device with testability, and method and... PLL semiconductor device with testability, and method and...

2005-04-05

2005-04-05

Le, N. (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

C324S765010, C331S025000, C327S157000

Reexamination Certificate

active

06876185

ABSTRACT:
On a semiconductor device20, fabricated are a VCO10A, an frequency divider by integer R21, a frequency divider by integer (P×N+A)22wherein each of P, N and A is an integer, A is variable and A<N, a phase comparator23, and a charge pump24. A low pass filter25having been confirmed to have standard characteristics is externally added to the semiconductor device20to construct a PLL circuit to be tested. The frequency divider22is of a pulse swallow type and has a control input for setting the integer A at ones in the vicinity of a value in normal use by user. The control input is connected to external terminals D0and D1of the semiconductor device20for simplifying a test. The semiconductor device20is judged whether it is acceptable or not in quality by checking whether or not the PLL circuit enters into a locked state within a given period in each cases of A=A1and A=A2, where A1<A0<A2and A0is a value in normal use by user.

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