PLL filter leakage sensor

Details PLL filter leakage sensor PLL filter leakage sensor

2007-01-30

2007-01-30

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S106000, C455S180300

Reexamination Certificate

active

10870533

ABSTRACT:
The present invention provides a method, apparatus, and computer program for measuring the current leakage in a Low Pass Filter (LPF) capacitor of a Phased Locked Loop (PLL). As a result of thinner and thinner film capacitors in Complementary Metal-Oxide Semiconductor (CMOS) technology, leakage current, which causes a PLL to drift out of phase lock, has become an increasingly difficult problem. To overcome the leakage current problems, knowing the leakage current of an LPF capacitor is important to implement the correction circuitry. In the present invention, an external interface and a time interface analyzer are used to charge the LPF capacitor and measure the output frequency of the PLL's Voltage Controlled Oscillator. Because of the change in the output frequency, the leakage current can be determined.

REFERENCES:
patent: 5648964 (1997-07-01), Inagaki et al.
patent: 6832173 (2004-12-01), Starr et al.
patent: 6919746 (2005-07-01), Suzuki

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