Measuring and testing – Testing of apparatus
Patent
1999-06-08
2000-03-14
Raevis, Robert
Measuring and testing
Testing of apparatus
G01D 1800
Patent
active
060357312
ABSTRACT:
A handler throw measuring unit (HTMU) for calibrating a test handler that handles an integrated circuit package. The throw measuring unit includes a plurality of pogo pins that are coupled to a base plate and a spring plate. The pogo pins are deflected when a test handler pushes the spring plate. The HTMU has a gauge that is coupled to the spring plate to measure the amount of pogo pin deflection. The amount of deflection can be provided on a numerical readout. An operator can incrementally move the test handler until the readout provides a desired value.
REFERENCES:
patent: 5103572 (1992-04-01), Ricklefs
patent: 5253428 (1993-10-01), McMurtry
patent: 5269067 (1993-12-01), Waeldele et al.
patent: 5319353 (1994-06-01), Ohnishi et al.
patent: 5665897 (1997-09-01), Lippmann et al.
Birk Tom
Langmack John
Schroeder Chris
Intel Corporation
Raevis Robert
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