Optics: measuring and testing – Sample – specimen – or standard holder or support
Reexamination Certificate
2005-02-22
2005-02-22
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
Sample, specimen, or standard holder or support
Reexamination Certificate
active
06859271
ABSTRACT:
The invention relates to a platen to be used with a sample tray of an automatic sampler. According to an aspect, the platen includes both electrically conductive and reflective areas that can be used to calibrate the sample tray. According to another aspect, calibration of the sample tray can be performed in all three dimensions. According to another aspect, the platen is used to calibrate the sample tray, including its height and the location of its wells. The platen may include electrically-responsive (i.e., conductive) and optically-responsive (i.e., reflective) areas that can be sensed by electrical sensors and optical sensors in order to compute the coordinates of representative wells.
REFERENCES:
patent: 3456490 (1969-07-01), Stone
patent: 4298570 (1981-11-01), Lillig et al.
patent: 4322216 (1982-03-01), Lillig et al.
patent: 4695727 (1987-09-01), Brierley et al.
patent: 4757437 (1988-07-01), Nishimura
patent: 4816730 (1989-03-01), Wihelm, Jr. et al.
patent: 5215377 (1993-06-01), Sugano
patent: 5215923 (1993-06-01), Kinoshita et al.
patent: 5224775 (1993-07-01), Reading et al.
patent: 5258931 (1993-11-01), Hassler, Jr.
patent: 5286652 (1994-02-01), James et al.
patent: 5293404 (1994-03-01), Takeda
patent: 5398556 (1995-03-01), Lang
patent: 5483843 (1996-01-01), Miller et al.
patent: 5721384 (1998-02-01), Tanihata
U.S. Appl. No. 09/767,903.
U.S. Appl. No. 09/796,748.
U.S. Appl. No. 09/796,750.
U.S. Appl. No. 09/796,733.
U.S. Appl. No. 09/796,749.
TA Instruments, Thermal Analysis and Rheology, catalog of products.
TA Instruments, Thermal Analysis and Rheology, Auto DSC System.
http:\\www.e-thermal.com\dsc204.htm Differential Scanning Calorimeter DSC Phoenix, Nov. 2000.
http:\\www.e-thermal.com\dsc204_asc.htm DSC 204 ASC the Automatic Sample Changer.
file://C:\temp\Instruments Home Products.htm As6 Autosampler for Pyris 6 Series Thermal Analyzers, Perkin Elmer Instruments, 1998-2000.
file://C:/Windows/temp\SeikoRobotics.htm EXSTAR6000 Seiko Robotics.
Differential Scanning Calorimetry for all Requirements, Mettler Toledo, Feb. 1996.
Carney Christopher F.
Ferguson Fred L.
Liu Weidong
Reader John R.
Nguyen Tu T.
Shaw Pittman LLP
TA Instruments-Waters LLC
LandOfFree
Platen for automatic sampler does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Platen for automatic sampler, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Platen for automatic sampler will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3481076