Plasmon resonance phase imaging

Details Plasmon resonance phase imaging Plasmon resonance phase imaging

2005-11-29

2005-11-29

Lee, Andrew H. (Department: 2877)

Optics: measuring and testing

Of light reflection

C356S517000

Reexamination Certificate

active

06970249

ABSTRACT:
A device for measuring simultaneously the phase at each point of an image formed by light reflected from a sample in which the phase has been modified by plasma resonance in a thin conducting layer, the device comprising a thick transparent substrate (10) on which a thin layer of conducting material is deposited (13); a light source (1); an interferometer; an imaging means (9); and a processing means.

REFERENCES:
patent: 5185810 (1993-02-01), Freischlad
patent: 5220403 (1993-06-01), Batchelder et al.
patent: 5415842 (1995-05-01), Maule
patent: 5999262 (1999-12-01), Dobschal et al.
patent: 6628376 (2003-09-01), Nikitin et al.

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