Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1998-03-30
2000-11-07
Bowers, Charles
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438700, 438706, 438710, 438712, 438723, H01L 2118
Patent
active
061436666
ABSTRACT:
A method for forming a via through a dielectric layer within a microelectronics fabrication. There is first provided a substrate employed within a microelectronics fabrication. There is then formed over the substrate a silicon oxide dielectric layer, where the silicon oxide dielectric layer is formed through use of a plasma enhanced chemical vapor deposition (PECVD) method employing tetra-ethyl-ortho-silicate (TEOS) as a silicon source material. There is then treated the silicon oxide dielectric layer with a plasma to form a plasma treated silicon oxide dielectric layer. Finally, there is then formed upon the plasma treated silicon oxide dielectric layer a patterned photoresist layer employed in defining the location of a via to be formed through the plasma treated silicon oxide dielectric layer. Through use of the method, the patterned photoresist layer is less susceptible to delamination from the plasma treated silicon oxide dielectric layer within an isotropic etch method employed in etching the plasma treated silicon oxide dielectric layer than is an otherwise equivalent patterned photoresist layer from an otherwise equivalent silicon oxide dielectric layer absent the plasma treatment.
REFERENCES:
patent: 5180689 (1993-01-01), Liu et al.
patent: 5219791 (1993-06-01), Freiberger
patent: 5453403 (1995-09-01), Meng et al.
patent: 5552343 (1996-09-01), Hsu
patent: 5622883 (1997-04-01), Kim
patent: 5807660 (1998-09-01), Lin et al.
Chen Yin
Lien How-Ming
Lin Sen-Horng
Ackerman Stephen B.
Bowers Charles
Kilday Lisa
Saile George O.
Stanton Stephen G.
LandOfFree
Plasma surface treatment method for forming patterned TEOS based does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Plasma surface treatment method for forming patterned TEOS based, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Plasma surface treatment method for forming patterned TEOS based will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1640684