Plasma sensors and related methods

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Reexamination Certificate

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07908115

ABSTRACT:
Plasma sensors, systems and related methods are described. An example method for predicting an event includes providing a carrier signal across two electrodes and forming a plasma between the two electrodes. The example method also includes measuring a modulated signal from the plasma, manipulating the modulated signal to produce a value and comparing the value to a threshold. Finally, the example method includes determining the likelihood of the event based on the comparison.

REFERENCES:
patent: 5082421 (1992-01-01), Acton et al.
patent: 5141391 (1992-08-01), Acton et al.
patent: 5275528 (1994-01-01), Freeman et al.
patent: 5340271 (1994-08-01), Freeman et al.
patent: 6098010 (2000-08-01), Krener et al.
patent: 6793455 (2004-09-01), Prasad et al.
patent: 7275013 (2007-09-01), Matlis et al.
patent: 7605595 (2009-10-01), May
patent: 2006/0288703 (2006-12-01), Kurtz et al.
patent: 2007/0126292 (2007-06-01), Lugg
patent: 2008/0067283 (2008-03-01), Thomas
patent: 2009/0065064 (2009-03-01), Morris et al.
patent: 9855837 (1998-12-01), None
patent: 2007106863 (2007-09-01), None
Matlis et al., “A.C. Plasma Anemometer for Hypersonic Mach Number Experiments”, 2005, IEEE, pp. 245-256.
“PCT International Search Report,” issued by the United States Patent and Trademark Office on Dec. 24, 2008, in connection with international application No. PCT/US08/79389, 3 Pages.
“PCT Written Opinion of the International Searching Authority,” issued bythe International Searching Authority on Dec. 24, 2008, in connection with international application No. PCT/US08/79389, 7 Pages.
“PCT International Search Report,” issued by the International Searching Authority on Feb. 2, 2009, in connection with international application No. PCT/US2008/084717, (2 pages).
“PCT Written Opinion of the International Searching Authority,” issued by the International Searching Authority on Feb. 2, 2009, in connection with international application No. PCT/US2008/084717, (4 pages).

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