Coating apparatus – Gas or vapor deposition – With treating means
Patent
1996-08-13
1998-07-14
Breneman, R. Bruce
Coating apparatus
Gas or vapor deposition
With treating means
118723E, 156345, C23C 1600
Patent
active
057798036
ABSTRACT:
An apparatus for subjecting a semiconductor wafer having an uncovered marginal portion, from which a photoresist film is removed, to an anisotropic etching. The apparatus comprises a process chamber which can be set to a vacuum. Upper and lower electrodes opposite to each other are provided in the process chamber. An etching gas is made into plasma between these electrodes. An electrostatic chuck is arranged on the lower electrode. A wafer is mounted on the electrostatic chuck. A ring made of dielectric material, movable upward and downward, is arranged between the electrodes. A central portion of the ring is formed as a hood having a recessed shape corresponding to the marginal portion of the wafer. During the etching, the hood covers the marginal portion of the wafer under a plasma sheath, so as to be out of contact with the wafer, thereby preventing the marginal portion of the wafer from being etched.
REFERENCES:
patent: 5350479 (1994-09-01), Collins et al.
patent: 5356515 (1994-10-01), Tahara et al.
patent: 5459632 (1995-10-01), Birang et al.
patent: 5560804 (1996-10-01), Higuchi et al.
Hosoda Shozo
Kurono Yoichi
Tozawa Shigeki
Alejandro Luz
Breneman R. Bruce
Tokyo Electron Limited
Tokyo Electron Yamanashi Limited
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