Plasma mass spectrometer

Radiant energy – Ionic separation or analysis – With sample supply means

Reexamination Certificate

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Details

C250S289000, C250S281000, C250S282000, C250S292000, C250S286000, C435S004000

Reexamination Certificate

active

07119330

ABSTRACT:
A plasma source mass spectrometer (20) having an ion beam extraction electrode (45) associated with a skimmer cone (40) to restrict the pumping of gas from a region (60) immediately behind the skimmer cone orifice (42) to provide a higher pressure (e.g. 1–10−2Torr) in the region (60) compared to the pressure downstream of the electrode (45) (e.g. 10−3–10−4Torr). This provides a collisional gas volume (60) for plasma (28) for attenuating polyatomic and multicharged interfering ions prior to extraction of an ion beam (49). In one embodiment a substance (e.g. hydrogen) can be supplied into the region (60) to assist attenuation of polyatomic and multicharged interfering ions by reactive or collisional interactions.

REFERENCES:
patent: 4740696 (1988-04-01), Osawa et al.
patent: 5051584 (1991-09-01), Gray et al.
patent: 5767512 (1998-06-01), Eiden et al.
patent: 6265717 (2001-07-01), Sakata et al.
patent: 6545270 (2003-04-01), Speakman et al.
patent: 0 813 228 (1997-12-01), None
patent: 10-040857 (1998-02-01), None

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