Plasma ion source mass spectrometer

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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Details

C250S281000, C250S288000

Reexamination Certificate

active

07977649

ABSTRACT:
Provided is a plasma ion source mass spectrometer with an ion deflector lens having an improved removal ratio of photons and neutral particles as compared with the conventional art while an ion transmittance is maintained. The ion deflector includes an input side plate-like electrode, an output side plate-like electrode, and a tubular electrode disposed between the input side plate-like electrode and the output side plate-like electrode. The tubular electrode is of a point asymmetrical configuration. The tubular electrode is arranged so that a center axis of the tubular electrode is closer to an axis of travel of ions upstream of the input side plate-like electrode than an axis of travel of ions downstream of the output side plate-like electrode.

REFERENCES:
patent: 4481415 (1984-11-01), Takeda et al.
patent: 5481107 (1996-01-01), Takada et al.
patent: 5838003 (1998-11-01), Bertsch et al.
patent: 6031379 (2000-02-01), Takada et al.
patent: 2010/0084549 (2010-04-01), Ermakov et al.
patent: 61-107650 (1986-05-01), None
patent: 8-7829 (1996-01-01), None
patent: 10-97838 (1998-04-01), None
patent: 2000-67805 (2000-03-01), None
patent: 2000-100375 (2000-04-01), None
patent: 2002-525821 (2002-08-01), None
patent: 2004-71470 (2004-03-01), None
patent: 2004071470 (2004-03-01), None

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