Plasma ion mass spectrometer and plasma mass spectrometry using

Details Plasma ion mass spectrometer and plasma mass spectrometry using Plasma ion mass spectrometer and plasma mass spectrometry using

1995-10-05

1997-04-01

Berman, Jack I.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, 250282, H01J 4906

Patent

active

056169183

ABSTRACT:
A plasma ion mass spectrometer capable of improving detection accuracy in mass spectrometry by reducing background noise due to ultraviolet radiation and neutral particles, and a plasma ion mass spectrometry using the same. A sample is ionized with plasma in a plasma generating portion. The flow of the ionized sample is shielded by a shield plate after an elapse of a specified time, and ions of the sample accumulated before the shielding is held in an ion trap type mass spectrometric portion for a specified time. The ions of the sample held for the specified time are then subjected to mass spectrometry. During ions of the sample accumulated before the shielding are held, ultraviolet radiation mixed with the ions of the sample disappears, and thereby only ions of the sample can be subjected to mass spectrometry. As a result, background noise is reduced, to improve detection accuracy in mass spectrometry.

REFERENCES:
patent: 4540884 (1985-09-01), Stafford et al.
patent: 4955717 (1990-09-01), Henderson
patent: 5179278 (1993-01-01), Douglas
patent: 5481107 (1996-01-01), Takada et al.
Spectrochimica ACTA., vol. 49B, No. 9, pp. 901-914 Konosuke Oishi et al.: Elemental Mass Spectrometry Using a Nitrogen Microwave-induced Plasma as an Ion Source, May 1994.

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