Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Patent
1984-11-08
1986-04-29
Andrews, R. L.
Chemistry: electrical and wave energy
Apparatus
Coating, forming or etching by sputtering
204164, 204192R, 118 501, 118723, 156345, C23C 1400
Patent
active
045855412
ABSTRACT:
A cusp field is applied between a plasma source of a vacuum chamber of a plasma anodization system and a substance such as a semiconductor substrate or a metal plate to be oxidized so that the substance may not be adversely affected by the plasma. The temperature control can be conducted independently of the plasma generating condition because the substance to be treated is not adversely affected by the plasma in a direct manner.
REFERENCES:
patent: 4180450 (1979-12-01), Morrison
Physics & Chem. Dictionary (3rd Ed. 1971), p. 241.
Introduction to Plasma Physics, Chen, 1974, pp. 38-41.
Advances in Plasma Physics, Chen, vol. 4, (1971), pp. 79-83, 120-122.
Kimura Shin'ichiro
Miyake Kiyoshi
Warabisako Terunori
Andrews R. L.
Hitachi , Ltd.
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