Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2006-05-30
2006-05-30
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257S757000, C257S748000, C257S764000, C257S769000, C257S774000, C257S602000, C257S532000
Reexamination Certificate
active
07053462
ABSTRACT:
A conductive material is provided in an opening formed in an insulative material. The process involves first forming a conductive material over at least a portion of the opening and over at least a portion of the insulative material which is outside of the opening. Next, a metal-containing fill material is formed over at least a portion of the conductive material which is inside the opening and which is also over the insulative material outside of the opening. The metal-containing material at least partially fills the opening. At least a portion of both the metal-containing fill material and the conductive material outside of the opening is then removed. Thereafter, at least a portion of the metal-containing fill material which is inside the opening is then removed.
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Drynan John M.
Yang Sam
Dickstein , Shapiro, Morin & Oshinsky, LLP
Mandala Jr. Victor A.
Micro)n Technology, Inc.
Pert Evan
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