Planarity diagnostic system, e.g., for microelectronic...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

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C324S758010

Reexamination Certificate

active

11623505

ABSTRACT:
Maintaining proper planarity of elements of a microelectronic component test system helps ensure reliable operation of the test system. Aspects of the invention provide test systems and methods for verifying planarity of, for example, a head and a support surface of a microelectronic component test system. In one exemplary method, a probe card is mounted to and electrically coupled to a head of a microelectronic component test system. The probe card has an array of probes. A contact surface of the support is moved with respect to the head and a change in contact condition of each of the probes is recorded in a first data set. The orientation of the probe card with respect to the contact surface is changed, the contact surface is moved with respect to the head again and a change in contact condition of each of the probes is recorded in a second data set.

REFERENCES:
patent: 4751457 (1988-06-01), Veenendaal
patent: 4918374 (1990-04-01), Stewart et al.
patent: 5065092 (1991-11-01), Sigler
patent: 5081796 (1992-01-01), Schultz
patent: 5232875 (1993-08-01), Tuttle et al.
patent: 5234867 (1993-08-01), Schultz et al.
patent: 5240552 (1993-08-01), Yu et al.
patent: 5244534 (1993-09-01), Yu et al.
patent: 5245790 (1993-09-01), Jerbic
patent: 5245796 (1993-09-01), Miller et al.
patent: 5421769 (1995-06-01), Schultz et al.
patent: 5433651 (1995-07-01), Lustig et al.
patent: 5449314 (1995-09-01), Meikle et al.
patent: 5486129 (1996-01-01), Sandhu et al.
patent: 5514245 (1996-05-01), Doan et al.
patent: 5533924 (1996-07-01), Stroupe et al.
patent: 5540810 (1996-07-01), Sandhu et al.
patent: 5618381 (1997-04-01), Doan et al.
patent: 5642056 (1997-06-01), Nakajima et al.
patent: 5643060 (1997-07-01), Sandhu et al.
patent: 5658183 (1997-08-01), Sandhu et al.
patent: 5658190 (1997-08-01), Wright et al.
patent: 5664988 (1997-09-01), Stroupe et al.
patent: 5679065 (1997-10-01), Henderson
patent: 5702292 (1997-12-01), Brunelli et al.
patent: 5730642 (1998-03-01), Sandhu et al.
patent: 5747386 (1998-05-01), Moore
patent: 5761823 (1998-06-01), Williamson et al.
patent: 5792709 (1998-08-01), Robinson et al.
patent: 5795495 (1998-08-01), Meikle
patent: 5807165 (1998-09-01), Uzoh et al.
patent: 5830806 (1998-11-01), Hudson et al.
patent: 5851135 (1998-12-01), Sandhu et al.
patent: 5868896 (1999-02-01), Robinson et al.
patent: 5882248 (1999-03-01), Wright et al.
patent: 5893754 (1999-04-01), Robinson et al.
patent: 5895550 (1999-04-01), Andreas
patent: 5934980 (1999-08-01), Koos et al.
patent: 5945347 (1999-08-01), Wright
patent: 5954912 (1999-09-01), Moore
patent: 5967030 (1999-10-01), Blalock
patent: 5972792 (1999-10-01), Hudson
patent: 5980363 (1999-11-01), Meikle et al.
patent: 5981396 (1999-11-01), Robinson et al.
patent: 5994224 (1999-11-01), Sandhu et al.
patent: 5997384 (1999-12-01), Blalock
patent: 6039633 (2000-03-01), Chopra
patent: 6040245 (2000-03-01), Sandhu et al.
patent: 6043668 (2000-03-01), Carney
patent: 6054015 (2000-04-01), Brunelli et al.
patent: 6066030 (2000-05-01), Uzoh
patent: 6074286 (2000-06-01), Ball
patent: 6083085 (2000-07-01), Lankford
patent: 6110820 (2000-08-01), Sandhu et al.
patent: 6120354 (2000-09-01), Koos et al.
patent: 6125255 (2000-09-01), Litman
patent: 6135856 (2000-10-01), Tjaden et al.
patent: 6139402 (2000-10-01), Moore
patent: 6143123 (2000-11-01), Robinson et al.
patent: 6143155 (2000-11-01), Adams et al.
patent: 6152808 (2000-11-01), Moore
patent: 6166988 (2000-12-01), Ryu et al.
patent: 6176992 (2001-01-01), Talieh
patent: 6187681 (2001-02-01), Moore
patent: 6191037 (2001-02-01), Robinson et al.
patent: 6193588 (2001-02-01), Carlson et al.
patent: 6200901 (2001-03-01), Hudson et al.
patent: 6203404 (2001-03-01), Joslyn et al.
patent: 6203413 (2001-03-01), Skrovan
patent: 6206756 (2001-03-01), Chopra et al.
patent: 6210257 (2001-04-01), Carlson
patent: 6213845 (2001-04-01), Elledge
patent: 6218316 (2001-04-01), Marsh
patent: 6227955 (2001-05-01), Custer et al.
patent: 6234874 (2001-05-01), Ball
patent: 6234877 (2001-05-01), Koos et al.
patent: 6234878 (2001-05-01), Moore
patent: 6237483 (2001-05-01), Blalock
patent: 6250994 (2001-06-01), Chopra et al.
patent: 6251785 (2001-06-01), Wright
patent: 6261151 (2001-07-01), Sandhu et al.
patent: 6261163 (2001-07-01), Walker et al.
patent: 6267650 (2001-07-01), Hembree
patent: 6273786 (2001-08-01), Chopra et al.
patent: 6273796 (2001-08-01), Moore
patent: 6276996 (2001-08-01), Chopra
patent: 6306012 (2001-10-01), Sabde
patent: 6306014 (2001-10-01), Walker et al.
patent: 6306768 (2001-10-01), Klein
patent: 6312558 (2001-11-01), Moore
patent: 6328632 (2001-12-01), Chopra
patent: 6331488 (2001-12-01), Doan et al.
patent: 6350180 (2002-02-01), Southwick
patent: 6350691 (2002-02-01), Lankford
patent: 6352466 (2002-03-01), Moore
patent: 6354923 (2002-03-01), Lankford
patent: 6354930 (2002-03-01), Moore
patent: 6358122 (2002-03-01), Sabde et al.
patent: 6358127 (2002-03-01), Carlson et al.
patent: 6358129 (2002-03-01), Dow
patent: 6359456 (2002-03-01), Hembree et al.
patent: 6361417 (2002-03-01), Walker et al.
patent: 6364757 (2002-04-01), Moore
patent: 6368190 (2002-04-01), Easter et al.
patent: 6368193 (2002-04-01), Carlson et al.
patent: 6368194 (2002-04-01), Sharples et al.
patent: 6368197 (2002-04-01), Elledge
patent: 6383934 (2002-05-01), Sabde et al.
patent: 6387289 (2002-05-01), Wright
patent: 6395620 (2002-05-01), Pan et al.
patent: 6402884 (2002-06-01), Robinson et al.
patent: 6428386 (2002-08-01), Bartlett
patent: 6447369 (2002-09-01), Moore
patent: 6496001 (2002-12-01), Barringer et al.
patent: 6498101 (2002-12-01), Wang
patent: 6511576 (2003-01-01), Klein
patent: 6520834 (2003-02-01), Marshall
patent: 6533893 (2003-03-01), Sabde et al.
patent: 6547640 (2003-04-01), Hofmann
patent: 6548407 (2003-04-01), Chopra et al.
patent: 6579799 (2003-06-01), Chopra et al.
patent: 6592443 (2003-07-01), Kramer et al.
patent: 6609947 (2003-08-01), Moore
patent: 6623329 (2003-09-01), Moore
patent: 6652764 (2003-11-01), Blalock
patent: 6666749 (2003-12-01), Taylor
patent: 6677771 (2004-01-01), Zhou et al.
patent: 6841991 (2005-01-01), Martin et al.
patent: 7019512 (2006-03-01), Martin et al.
patent: 2006/0125471 (2006-06-01), Martin et al.
KLA-Tencor Corporation, P-15 Profiler Product Overview, 2 pages, http://www.kla-tencor.com/Cdownload/pdfs/ParametricP-15.pdf (accessed Aug. 8, 2002), Copyright 2001.
Applied Precision, Inc., Advanced Maintenance Manual, PrecisionPoint V2 and VX2 Systems, Chapter 5, Calibrations, pp. 5-73-5-79, Copyright 2000, Issaquah, Washington.
Applied Precision, Inc., Hardware Manual, PrecisionPoint VX2 and PrecisionPoint VX2 Extension Systems, PrecisionPoint 8.0, Chapter 5, Calibrations, pp. 58-68, Copyright 2000, Issaquah, Washington.
Applied Precision, LLC, Precision Point Motherboards, 2 pages, http://www.api.com/products/semi/motherboards—main.html (accessed Aug. 8, 2002), Copyright 2001-2002.
Langfischer, H., Wafer Prober Measurement and Characterization, 2 pages, Vienna University of Technology—Institute for Solid State Electronics, http://www.fke.tuwien.ac.at/silizium/Langfischer/waferprober.htm (accessed Aug. 8, 2002).
SUSS MicroTec, “PA300,” 3 pages (accessed Dec. 27, 2002) http://radact.suss.com/radactContent/main/english/167/main.php?rad—id=346.

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