Planar trenches

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

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438435, H01L 2176

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active

060636939

ABSTRACT:
Method for improving the topography over trench structures in which the provision of extra poly-semiconductor material e.g. polysilicon or nitrate or oxide in the regions of the trench edges and, if necessary, the subsequent oxidation of the extra material prevents the occurrence of regions of high mechanical stress.

REFERENCES:
patent: 5175122 (1992-12-01), Wang et al.
patent: 5561073 (1996-10-01), Jerome et al.
patent: 5698891 (1997-12-01), Tomita et al.
patent: 5792685 (1998-08-01), Hammerl et al.
Wolf, S. "Silicon Processing for the VLSI Era, vol. II", Lattise Press USA, pp. 45-56, Fig. 2.34, 2.35, 1990.

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