Superconductor technology: apparatus – material – process – High temperature devices – systems – apparatus – com- ponents,... – Measuring or testing system or device
Patent
1993-04-19
1995-08-01
Jackson, Jerome
Superconductor technology: apparatus, material, process
High temperature devices, systems, apparatus, com- ponents,...
Measuring or testing system or device
505190, 505329, 505702, 505832, 505874, 505846, 505922, 257 33, 257 34, G01R 3300, H01L 3922, H01L 3914, H01L 3924
Patent
active
054380367
ABSTRACT:
A SQUID comprises a substrate, a washer of an oxide superconductor thin film formed on a principal surface of the substrate, a hole shaped a similar figure to the washer at the center of the washer, a slit formed between one side of the washer and the hole, and a Josephson junction which connects portions of the washer at the both sides of the slit across the slit. In the SQUID, the ratio of similarity of the washer to the hole ranges 100 to 2500.
REFERENCES:
patent: 5157466 (1992-10-01), Char et al.
Matlashov et al., "High Sensitive Magnetometers and Gradiometers Based on DC SQUIDS with Flux Focuser", IEEE Trans. on Magnetics, vol. 27, No. 2, Mar. 1991, pp. 2963-2966.
Zhang et al., "Low-Noise YBa.sub.2 Cu.sub.3 O.sub.7 rf SQUID Magnetometer," Applied Physics Letters, vol. 60, No. 5, Feb. 3, 1992, pp. 645-647.
Zhang et al., "Sensitive rf-SQUIDs and Magnetometers Operating at 77K," IEEE Trnas. on Magnetics, vol. 3, No. 1, Mar. 1993, pp. 2465-2468.
Enpuku et al., "DC Superconducting Quantum Inteference Device Utilizing the High T.sub.c Step-Edge Junction", Journal of Applied Physics, vol. 30, No. 6B, Jun. 1991, pp. L1121-L1124, Japanese.
Gross et al., "Low Noise YBa.sub.2 Cu.sub.3 O.sub.7-.delta. Grain Boundary Junction dc SQUIDs", Applied Physics Letters, vol. 57, No. 7, Aug. 1990, pp. 727-729.
Oh et al., "YBaCuO Input Coils with Low T.sub.c and High T.sub.c SQUIDs", Applied Physics Letters, vol. 56, No. 25, Jun. 1990, pp. 2575-2577.
Tanaka et al.,"Properties of YBa.sub.2 Cu.sub.3 O.sub.7-y Large Washer SQUIE", Japanese Journal of Applied Physics, vol. 32, No. 5A, May 1993, pp. L662-L664.
Itozaki Hideo
Matsuura Takashi
Jackson Jerome
Sumitomo Electric Industries Ltd.
Tang Alice W.
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