Planar avalanche photodiode

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Light responsive structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S186000, C257S191000, C257S438000, C257SE31063, C257SE31064

Reexamination Certificate

active

07348608

ABSTRACT:
A planar avalanche photodiode includes a small localized contact layer on the top of the device produced by either a diffusion or etching process and a semiconductor layer defining a lower contact area. A semiconductor multiplication layer is positioned between the two contact areas and a semiconductor absorption layer is positioned between the multiplication layer and the upper contact layer. The photodiode has a low capacitance and a low field near the edges of the semiconductor multiplication and absorption layers.

REFERENCES:
patent: 4236069 (1980-11-01), Laughlin
patent: 4597004 (1986-06-01), Longeway et al.
patent: 4686550 (1987-08-01), Capasso et al.
patent: 4840916 (1989-06-01), Yasuda et al.
patent: 5126281 (1992-06-01), Carey et al.
patent: 5146296 (1992-09-01), Huth
patent: 5179430 (1993-01-01), Torikai
patent: 5365077 (1994-11-01), Metzger
patent: 5539221 (1996-07-01), Tsuji et al.
patent: 5552629 (1996-09-01), Watanabe
patent: 5654578 (1997-08-01), Watanabe
patent: 5818096 (1998-10-01), Ishibashi et al.
patent: 6081019 (2000-06-01), White
patent: 6104047 (2000-08-01), Watanabe
patent: 6107652 (2000-08-01), Scavennec et al.
patent: 6229161 (2001-05-01), Nemati et al.
patent: 6229162 (2001-05-01), Watanabe
patent: 6326650 (2001-12-01), Allam
patent: 6359322 (2002-03-01), Haralson et al.
patent: 6548878 (2003-04-01), Nauleau et al.
patent: 6635908 (2003-10-01), Tanaka et al.
patent: 6794631 (2004-09-01), Clark
patent: 2002/0070384 (2002-06-01), Clark et al.
patent: 2003/0021322 (2003-01-01), Steinle et al.
patent: 09-199753 (1997-07-01), None
patent: WO 03/065416 (2003-08-01), None
patent: WO 03/065417 (2003-08-01), None
patent: WO 03/065418 (2003-08-01), None
Watanabe et al., IEEE Photonics Tehncology Letter 8, pp. 827-829, 1996.
M.A. Itzler, C.S. Wang, S. McCoy, N. Codd and N. Komba, Planar bulk InP avalanche photodiode design for 2.5 and 10Gb/s applications, Proc 24th ECOC 1998, paper MoB03.
L.E. Tarof, J. Yu, R. Bruce, D.G. Knight, T. Baird and B. Oosterbrink, High frequency performance of seperate absorption grading charge and multiplication InP/InGaAs avalanche photodiodes, IEEE Photon. Technol. Lett. 5, 672-674, 1993.
Watanabe, T. Nakata, M. Tsuji, K. Makita, K. Taguchi, High reliability and low dark current 10 Gb/s planar superlattice avalanche photodiodes, IEEE Photon. Technol. Lett. 9, 1619-1621, 1997.
J.C. Campbell, S. Demiquel, F. Ma, A. Beck, X. Guo, S. Wang, X. Zeng, X. Li, J.D. Beck, M.A. Kinch, A. Huntington, L.A. Coldren, J. Decobert, N. Tscherptner, Recent advances in avalanche photodiodes, IEEE J. Select. Topics Quantum Electron., 10, 777-787, 2004.
R.R. Sutherland, C.P. Skrimshire, M.J. Robertson, A reliability methodology applied to very high reliability planar InGaAs/inP PIN photodetectors, Br. Telecom. Technol. J., 7, 69-77, Jan. 1989.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Planar avalanche photodiode does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Planar avalanche photodiode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Planar avalanche photodiode will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3980833

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.