Optics: measuring and testing – By alignment in lateral direction
Patent
1999-08-20
2000-10-24
Font, Frank G.
Optics: measuring and testing
By alignment in lateral direction
356400, G01B 1100
Patent
active
061375799
ABSTRACT:
A planar alignment system and method for aligning a first planar surface parallel to a second planar surface including: attaching a target base having a first planar reflective surface so that the first planar reflective surface is parallel to the first planar surface, positioning a reflector having a second planar reflective surface so that the second planar reflective surface is parallel to the second planar surface, positioning a planar target parallel to one of the planar surfaces, transmitting a radiation beam, at an angle perpendicular to one of the planar surfaces, from a radiation transmitter releasably attached to that planar surface, toward the planar reflective surface of the other planar surface, and reflecting the transmitted radiation beam between the planar reflective surfaces so that the reflected radiation beam strikes the planar target, producing a calibration point whose displacement from the originally transmitted radiation beam is indicative of the positional alignment between the first planar surface and the second planar surface.
REFERENCES:
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patent: 4566202 (1986-01-01), Hamar
patent: 5532815 (1996-07-01), Kipman et al.
patent: 5552883 (1996-09-01), Busch-Vishniac et al.
patent: 5661667 (1997-08-01), Rueb et al.
patent: 6031616 (2000-02-01), Seiffert
Font Frank G.
Stafira Michael P.
Teska Kirk
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