Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2007-02-16
2008-10-21
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257SE31126
Reexamination Certificate
active
07439541
ABSTRACT:
A pixel structure including a substrate, a gate, a patterned dielectric layer, a semiconductor layer, a source, a drain and a reflective pixel electrode is provided. The gate is disposed on the substrate, whereon the patterned dielectric layer is disposed to cover the gate. The patterned dielectric layer has a plurality of bumps and at least one opening; the bumps are disposed on the substrate exposed by the opening and the semiconductor layer is disposed on the patterned dielectric layer above the gate. The source and the drain are disposed on the semiconductor layer. The reflective pixel electrode is disposed on the patterned dielectric layer to cover the bumps and electrically connected with the drain. Hence, the pixel structure can achieve better reliability.
REFERENCES:
patent: 5510918 (1996-04-01), Matsunaga et al.
patent: 6433842 (2002-08-01), Kaneko et al.
Chu Ching-Yun
Huang Tzu-Fong
Lee Yi-Wei
Au Optronics Corporation
Jahan Bilkis
Jianq Chyun IP Office
Louie Wai-Sing
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