Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Reexamination Certificate
2007-04-17
2007-04-17
Allen, Stephone B. (Department: 2878)
Radiant energy
Photocells; circuits and apparatus
Photocell controlled circuit
C250S2140RC, C348S298000, C348S308000
Reexamination Certificate
active
11132496
ABSTRACT:
A pixel circuit for an image sensor uses a common reset transistor for resetting both of a photodiode node and a memory node. Respective transfer gates connect the common reset transistor to the photodiode node and to the memory node, and connect photodiode node and the memory node to each other. A source follower enabled with a row select gate provides a readout signal from the memory node. The use of the common reset transistor and the operational timing of the circuit elements improves fixed pattern noise arising from transistor feedthroughs in the pixel circuit.
REFERENCES:
patent: 5898168 (1999-04-01), Gowda et al.
patent: 6486503 (2002-11-01), Fossum
patent: 6507365 (2003-01-01), Nakamura et al.
patent: 6549234 (2003-04-01), Lee
patent: 6555842 (2003-04-01), Fossum et al.
patent: 6556224 (2003-04-01), Banno
patent: 6590611 (2003-07-01), Ishida et al.
patent: 6624456 (2003-09-01), Fossum et al.
patent: 6630957 (2003-10-01), Kuroda et al.
patent: 6667768 (2003-12-01), Fossum
patent: 6720592 (2004-04-01), Kindt et al.
patent: 6741283 (2004-05-01), Merrill et al.
patent: 6809767 (2004-10-01), Kozlowski et al.
patent: 6825059 (2004-11-01), Fossum
patent: 6975356 (2005-12-01), Miyamoto
patent: 7045754 (2006-05-01), Manabe et al.
patent: 2006/0007329 (2006-01-01), Panicacci
Alexander I. Krymski and Nianrong Tu, “A 9-V/LUX-S 5000-Frames/S 512 + 512 CMOS Sensor,” IEEE Transactions on Electron Devices, vol. 50, No. 1 Jan. 2003.
S. Seshadri, G. Yang, M. Ortiz, C. Wrigley and B. Pain, “CMOS Difference Imager With Charge-Leakage Compensation & Sum Output,” Submitted to the 2001 IEEE Workshop on CCDs and Advanced Image Sensors, Jun. 7-9, 2001, Lake Tahoe.
Guang Yang, Orly Yadid-Pecht, Chris Wrigley and Bedabrata Pain, “A Snap-Shot CMOS Active Pixel Imager for Low-Noise, High-Speed Imaging,” Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California.
International Search Report from PCT application PCT/US06/17563 dated Oct. 5, 2006.
Alexander Krymski D. B. A Alexima
Allen Stephone B.
Foley & Lardner LLP
Lee Patrick J.
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