Pixel and imager device having high-k dielectrics in...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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C257S234000, C257S291000, C257S292000, C257SE27133

Reexamination Certificate

active

07741660

ABSTRACT:
An imager device that has an isolation structure such that pinned photodiode characteristics are maintained without increasing doping levels. The invention provides an isolation structure to maintain pinned photodiode characteristics without increasing doping levels around the photodiode. By creating a substrate region surrounding the charge-collection region of the photodiode, the photodiode may be electrically isolated from the bulk substrate. This region fixes the depletion region so that it does not migrate toward the surface of the substrate or the STI region. By doing so, the region prevents charge from being depleted from the substrate and the accumulation region, reducing dark current.

REFERENCES:
patent: 5241198 (1993-08-01), Okada et al.
patent: 5679597 (1997-10-01), Moon
patent: 6046487 (2000-04-01), Benedict et al.
patent: 6225171 (2001-05-01), Yu et al.
patent: 6570222 (2003-05-01), Nozaki et al.
patent: 6642087 (2003-11-01), Nozaki et al.
patent: 6794698 (2004-09-01), Perng et al.
patent: 6803581 (2004-10-01), Prince et al.
patent: 7201174 (2007-04-01), Fukiage
patent: 7235835 (2007-06-01), Nagano et al.
patent: 2001/0025970 (2001-10-01), Nozaki et al.
patent: 2002/0117731 (2002-08-01), Kim et al.
patent: 2003/0201479 (2003-10-01), Birner et al.
patent: 2004/0011379 (2004-01-01), Anaokar et al.
patent: 2004/0021751 (2004-02-01), Ohno
patent: 2004/0146655 (2004-07-01), Seidl et al.
patent: 2004/0178430 (2004-09-01), Rhodes et al.
patent: 2004/0232494 (2004-11-01), Nagano et al.
patent: 2005/0042793 (2005-02-01), Mouli et al.
patent: 2005/0116275 (2005-06-01), Lin et al.
patent: 2005/0285154 (2005-12-01), Akram et al.
patent: 2006/0289252 (2006-12-01), Spina
patent: 2007/0170541 (2007-07-01), Chui et al.
S. G. Sazonov et al., “Charge properties of aluminum oxide layers synthesized by molecular layering,” Technical Physics Letters, vol. 24, No. 7, Jul. 1998, pp. 525 and 526.
N. Novkovski, “Breakdown and generation of interface states in oxynitride thin films on silicon,” Semicond. Sci. Technol. 17, No. 2, Jan. 10, 2002, pp. 93-96.

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