Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1979-10-05
1981-06-16
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
33125C, G01B 1114, G01B 1104
Patent
active
042734479
ABSTRACT:
A scanning unit for a measuring instrument including a measuring scale is pivotably mounted to a mounting member by a strip of material which forms a solid hinge which permits the scanning unit to pivot with respect to the mounting member about an axis substantially perpendicular to the scale and maintains a substantially fixed spacing between the scanning unit and the scale.
REFERENCES:
patent: 2596752 (1952-05-01), Williams
patent: 2886717 (1975-05-01), Williamson et al.
patent: 3584228 (1971-06-01), Kenyon
patent: 4047586 (1977-09-01), Dlugos
patent: 4184262 (1980-01-01), Kolb et al.
Dr. Johannes Heidenhain GmbH
Punter William H.
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