Pinned photodiode photodetector with common pixel...

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation

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C438S059000, C438S070000, C438S073000, C438S078000, C257S232000, C257S233000, C257S292000, C257SE27132, C257SE27134, C348S296000, C348S302000, C348S307000, C372S050121, C372S050100, C372S050120, C372S050210

Reissue Patent

active

RE042292

ABSTRACT:
delete-start id="DEL-S-00001" date="20110412" ?A lock in pinned photodiode photodetector includes a plurality of output ports which are sequentially enabled. Each time when the output port is enabled is considered to be a different bin of time. A specified pattern is sent, and the output bins are investigated to look for that pattern. The time when the pattern is received indicates the time of flight.delete-end id="DEL-S-00001" ?insert-start id="INS-S-00001" date="20110412" ?A CMOS active pixel image sensor includes a plurality of pinned photodiode photodetectors that use a common output transistor. In one configuration, the charge from two or more pinned photodiodes may be binned together and applied to the gate of an output transistor.insert-end id="INS-S-00001" ?

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