Electricity: conductors and insulators – Conduits – cables or conductors – Preformed panel circuit arrangement
Reexamination Certificate
2006-08-08
2006-08-08
Cuneo, Kamand (Department: 2841)
Electricity: conductors and insulators
Conduits, cables or conductors
Preformed panel circuit arrangement
C029S843000
Reexamination Certificate
active
07087846
ABSTRACT:
An electronic package and information handling system utilizing same wherein the package substrate includes an internally conductive layer coupled to an external pad to provide reinforced adhesion of the pad to the substrate to substantially prevent cracking, separation, etc. of the pad when the pad has a pin bonded thereto and the package is coupled to an external substrate (e.g., printed circuit board). The reinforced adhesion also prevents pad separation, etc. during periods of package handling, manufacture, etc.
REFERENCES:
patent: 4518112 (1985-05-01), Miller et al.
patent: 4970570 (1990-11-01), Agarwala et al.
patent: 5764485 (1998-06-01), Lebaschi
patent: 5875102 (1999-02-01), Barrow
patent: 5891606 (1999-04-01), Brown
patent: 6054652 (2000-04-01), Moriizumi et al.
patent: 6091155 (2000-07-01), Jonaidi
patent: 6188028 (2001-02-01), Haba et al.
patent: 6303877 (2001-10-01), Moriizumi et al.
patent: 6342682 (2002-01-01), Mori et al.
patent: 6359332 (2002-03-01), Shiraishi
patent: 6623283 (2003-09-01), Torigian et al.
patent: 2002/0096361 (2002-07-01), Saiki et al.
Printed Circuit Fabrication, vol. 20, No. 11, Nov., 1997, p. 42, 44, 46, 48 A New Approach . . .
Circuits Assembly, vol. 6, No. 2, Feb., 1995, p. 42, 44, 45, 46, 50 “Vias In Pads”.
IBM TDB vol. 26, No. 10B, Mar., 1984, p. 5736, “Stress Relief Printed Circuit Wiring”.
IBM TDB vol. 29, No. 8, Jan., 1987, pp. 3522-3525, “Pin Attachment System For Glass Ceramic”.
FI884-0345, “Localized Compressive Layer Strength Enhancement In Multilayer Glass-Ceramic Substrates With The Use of Screening”.
EN899-0022, “Design For Surface Mount Technology Pin Assembly”.
IBM TDB, vol. 36, No. 12, Dec. 1993, “Solder Ball Connection Engineering Change/Wire Add Rework Concepts”.
IBM Infogate, “A Reliability Assessment of Footprint Effects and Substrate Variables on Large C4 Arrays”.
Austin Technical Report, Phase I SBC Reliability Factorial Experiment Results And Discussion.
Cuneo Kamand
Endicott Interconnect Technologies, Inc.
Fraley Lawrence R.
Hinman, Howard & Kattell LLP
Norris Jeremy C.
LandOfFree
Pinned electronic package with strengthened conductive pad does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pinned electronic package with strengthened conductive pad, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pinned electronic package with strengthened conductive pad will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3645402