Pin electronics with high voltage functionality

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S765010, C324S1540PB, C714S724000, C714S733000

Reexamination Certificate

active

07102375

ABSTRACT:
In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.

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patent: 6879175 (2005-04-01), Conner
patent: 6885213 (2005-04-01), Sunter
patent: 2005/0189950 (2005-09-01), Lu

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