Pin driver for AC and DC semiconductor device testing

Details Pin driver for AC and DC semiconductor device testing Pin driver for AC and DC semiconductor device testing

2006-03-28

2006-03-28

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C324S1540PB

Reexamination Certificate

active

07019547

ABSTRACT:
A pin electronics circuit for use in automatic test equipment is disclosed. The pin electronics circuit includes a pin driver having an output adapted for coupling to a device-under-test pin, and a first input. AC input circuitry couples to a pattern generator to receive pattern test signals while DC input circuitry connects to a DC parametric controller. Selector circuitry selectively couples the AC and DC input circuitry to the pin driver first input.

REFERENCES:
patent: 4517512 (1985-05-01), Petrich et al.
patent: 5101153 (1992-03-01), Morong, III
patent: 5436559 (1995-07-01), Takagi et al.
patent: 5467024 (1995-11-01), Swapp
patent: 6133725 (2000-10-01), Bowhers
patent: 6331783 (2001-12-01), Hauptman
patent: 6404220 (2002-06-01), Hashimoto
patent: 6836136 (2004-12-01), Aghaeepour
patent: 6856158 (2005-02-01), Frame et al.

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