Pilot tone multiplexing of polarization states in heterodyne...

Details Pilot tone multiplexing of polarization states in heterodyne... Pilot tone multiplexing of polarization states in heterodyne...

2005-05-17

2005-05-17

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By polarized light examination

C250S559090, C398S065000, C398S152000

Reexamination Certificate

active

06894780

ABSTRACT:
A method and apparatus for determining polarization-resolved scattering parameters of an optical device. A method comprises stimulating a port of the optical device with a stimulation field having at least two polarization states, measuring the optical field emerging from the port in amplitude and phase, and calculating the scattering parameters using the measurements. By stimulating a port of an optical device with a stimulation field having at least two different polarization states, measurements needed to determine scattering parameters of the optical device can be conducted by stimulating the port with only one sweep of a swept optical source.

REFERENCES:
patent: 6239873 (2001-05-01), Videen
patent: 6380533 (2002-04-01), Jopson et al.
patent: 0 654 657 (1994-11-01), None
Patent Abstracts of Japan, vol. 0134, No. 06 (P-930), Sep. 8, 1989 (Sep. 08, 1989), & JP 1 147334 A (Sumitomo Electric Ind Ltd), Jun. 9, 1989 (Jun. 09, 1989), *abstract*.
European Search Report Dated: Nov. 3, 2004.

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