Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2005-07-12
2005-07-12
Lefkowitz, Edward (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
Reexamination Certificate
active
06915702
ABSTRACT:
Force detection devices may have high detection precision and may prevent current leakage through a strain gage126to the outside. For example, a force detection block120may include a semiconductor substrate122, a first insulating layer124and a semiconductor layer126(strain gage). The strain gage126preferably includes a site where resistance changes in accordance with the stress acting thereon. The strain gage126preferably constitutes at least a portion of a ridge130projects from the surface of the force detection block120. A force transmission block138may be attached to a top surface of the ridge130. The width of the first insulating layer124is preferably greater than the width of the semiconductor layer126.
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Fujitsuka Norio
Mizuno Kentaro
Omura Yoshiteru
Sakata Jiro
Tsukada Kouji
Kabushiki Kaisha Toyota Chuo Kenkyusho
Lefkowitz Edward
Miller Takisha
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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