1986-03-12
1988-04-19
James, Andrew J.
357 28, 357 60, H01L 2904, H01L 2910, H01L 2984
Patent
active
047393815
ABSTRACT:
A piezoresistive strain sensing device is comprised of a semiconductor single-crystal substrate, having crystal indices in the (100) phase, and having p-type and n-type diffused resistors formed therein. A diffused resistance gauge is formed of the p-type and n-type resistors. Temperature compensation means are formed adjacent the resistance gauge in the substrate.
REFERENCES:
patent: 3123788 (1964-03-01), Pfann et al.
patent: 3277698 (1966-10-01), Mason
patent: 3492861 (1970-02-01), Jund
patent: 3818289 (1974-06-01), Mudge et al.
patent: 3899695 (1975-08-01), Solomon et al.
patent: 3922705 (1975-11-01), Yerman
patent: 4028564 (1977-06-01), Streit et al.
patent: 4510671 (1985-04-01), Kurtz et al.
patent: 4672411 (1987-06-01), Shimizu et al.
Smith "Piezoresistance Effect . . . Silicon" Physical Review, vol. 94, No. 1, Apr. 1, 1954, pp. 42-49.
Miura Hideo
Nishimura Asao
Sakamoto Tatsuji
Hitachi , Ltd.
Jackson Jerome
James Andrew J.
LandOfFree
Piezoresistive strain sensing device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Piezoresistive strain sensing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Piezoresistive strain sensing device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2179606