Semiconductor device manufacturing: process – Chemical etching – Having liquid and vapor etching steps
Reexamination Certificate
2005-08-09
2005-08-09
Norton, Nadine G. (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Having liquid and vapor etching steps
C438S694000, C438S706000, C438S719000, C438S723000, C438S745000, C438S756000
Reexamination Certificate
active
06927171
ABSTRACT:
This device, which is used to measure pressures or accelerations for example, comprises an isolation layer (32) that holds at least one piezoresistive gauge (29). The side tangents (T) of this gauge essentially make up over 90° angles with the surface (37) of the isolation layer. The device may be created using processes of wet isotropic etching, chemical anisotropic etching or isolation material growth processes.
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Commissariat a l''Energie Atomique
Norton Nadine G.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Umez-Eronini Lynette T.
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