Measuring and testing – Gas analysis – Moisture content or vapor pressure
Reexamination Certificate
2007-02-27
2007-02-27
Williams, Hezron (Department: 2856)
Measuring and testing
Gas analysis
Moisture content or vapor pressure
C073S029020, C073S029050, C073S335020, C326S105000, C326S108000, C361S301100, C361S303000, C361S329000
Reexamination Certificate
active
11220543
ABSTRACT:
A capacitance type humidity sensor includes: a detection substrate including a detection portion on a first side of the detection substrate; and a circuit board including a circuit portion. The detection portion detects humidity on the basis of capacitance change of the detection portion. The circuit portion processes the capacitance change as an electric signal. The detection substrate further includes a sensor pad on a second side of the detection substrate. The sensor pad is electrically connected to the detection portion through a conductor in a through hole of the detection substrate.
REFERENCES:
patent: 3617830 (1971-11-01), Perna, Jr.
patent: 4144636 (1979-03-01), Burkhardt et al.
patent: 4881199 (1989-11-01), Kowalski
patent: 6445565 (2002-09-01), Toyoda et al.
patent: 6566893 (2003-05-01), Kiesewetter et al.
patent: 6580600 (2003-06-01), Toyoda et al.
patent: 6628501 (2003-09-01), Toyoda
patent: 6690569 (2004-02-01), Mayer et al.
patent: 6834547 (2004-12-01), Chen et al.
patent: 6882165 (2005-04-01), Ogura
patent: 2002/0109959 (2002-08-01), Toyoda et al.
patent: 2002/0114125 (2002-08-01), Toyoda et al.
patent: 2004/0254306 (2004-12-01), Isogai et al.
patent: A-56-74992 (1981-06-01), None
patent: A-60-147643 (1985-08-01), None
patent: U-61-26162 (1986-02-01), None
patent: A-62-182643 (1987-08-01), None
patent: U-2-140351 (1990-11-01), None
patent: A-3-109800 (1991-05-01), None
patent: A-4-346492 (1992-12-01), None
patent: A-5-114710 (1993-05-01), None
patent: A-6-58900 (1994-03-01), None
patent: A-9-27665 (1997-01-01), None
patent: A-10-84184 (1998-03-01), None
Hayashi Michitaka
Ishihara Masato
Isogai Toshiki
Itakura Toshikazu
Denso Corporation
Nippon Soken Inc.
Posz Law Group , PLC
Rogers David A.
Williams Hezron
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