Batteries: thermoelectric and photoelectric – Photoelectric – Cells
Reexamination Certificate
2007-05-08
2007-05-08
Nguyen, Nam (Department: 1753)
Batteries: thermoelectric and photoelectric
Photoelectric
Cells
C136S256000
Reexamination Certificate
active
10245087
ABSTRACT:
An ITO film as a transparent conductive film is formed on a semiconductor layer comprising an amorphous semiconductor or a microcrystalline semiconductor, a comb-like collecting electrode is formed on the ITO film, and a cover glass containing alkaline ions is placed on the ITO film and collecting electrode with a resin film made of EVA between them. The (222) plane orientation degree of the ITO film (transparent conductive film) is not less than 1.0, preferably not less than 1.2 and not more than 2.6, and more preferably not less than 1.4 and not more than 2.5. Alternatively, the transparent conductive film has an orientation of (321) planes on the boundary side with respect to the semiconductor layer and mainly an orientation of (222) planes in the remaining portion. When the total thickness of the ITO film is 100 nm, the (321)/(222) diffraction strength ratio in a 10 nm-thick portion on the semiconductor layer side is not less than 0.5 and not more than 2.5.
REFERENCES:
patent: 4663188 (1987-05-01), Kane
patent: 4732621 (1988-03-01), Murata et al.
patent: 5344498 (1994-09-01), Inoue
patent: 5413959 (1995-05-01), Yamamoto et al.
patent: 6271053 (2001-08-01), Kondo
patent: 1191395 (1998-08-01), None
patent: 461 908 (1991-12-01), None
patent: 0 860 885 (1998-08-01), None
J.S. Kim et al, “Characterisation of the properties of surface-treated indium-tin oxide thin films.” Synthetic Metals. 101 (1999) 111-112.
C. Nunes de Carvalho et al, “Effect of substrate temperature on the surface structure, composition and morphology of indium-tin oxide films.” Surface and Coatings Technology. 124 (2000) 70-75.
International Centre for Diffraction Data, Card 06-0416, In2O3 powder diffraction data.
Origin of Characteristic Grain-Subgrain Structure of Tin-Doped Indium Oxide Films, Masayuki Kamei et al. (vol. 259, No. 1, Apr. 1, 1995, pp. 38-45.
Oxidation Dependent Crystallization Behaviour of IO and ITO Thin Films Deposited By Reactive Thermal Deposition Technique, P. Thilakan et al. (vol. 55, No. 3, Sep. 4, 1998, pp. 195-200).
Properties of Indium Tin Oxide (ITO) Films Prepared By R.F. Reactive Magnetron Sputtering At Different Pressures, L. Meng et al. (vol. 303, No. 1-2, Jul. 15, 1997, pp. 151-155).
Variations in Microstructure and Composition of Indium Tin Oxide Film With the Deposition Technique, M. Rottmann et al. (vol. 31, 1996, pp. 6495-6500).
Shigesato et al., The Structural Changes of Indium-Tin Oxide and a-Wo3Films by Introducing Water to the Deposition Processes, Apr. 1991,Japanese Journal of Applied Physics30(4): 814-819.
Baba Toshiaki
Maruyama Eiji
Barton Jeffrey
Darby & Darby
Nguyen Nam
Sanyo Electric Co. Ltd
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