Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Reexamination Certificate
2006-05-02
2006-05-02
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
C356S432000
Reexamination Certificate
active
07036979
ABSTRACT:
In a photothermal spectroscopic analyzer in which a probe light is made to fall on a thermal lens produced in a sample by an input of an excitation light and the sample is analyzed in accordance with a change of the probe light which is caused by the thermal lens, a light source of excitation light is composed of semiconductor laser light emitting means, and a light source of the probe light is composed of another semiconductor laser light emitting means, and furthermore a condenser lens for focusing the excitation light upon the sample and a condenser lens for focusing the probe light upon the thermal lens are configured by a common condenser lens. Such a photothermal spectroscopic analyzer according to the present invention satisfies all the requirements of small size, low manufacturing cost, high sensitivity, high precision, maintenance free performance, short start-up time, and automatic measurement for such a device as to perform POC analysis.
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Asahi Kasei Kabushiki Kaisha
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Verbitsky Gail
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