Photothermal deflection densitometer for thin layer chromatograp

Details Photothermal deflection densitometer for thin layer chromatograp Photothermal deflection densitometer for thin layer chromatograp

1983-12-27

1986-05-27

Yasich, Daniel M.

Optics: measuring and testing

For light transmission or absorption

356344, 374 45, 374124, G01J 342, G01N 2141

Patent

active

045912726

ABSTRACT:
A photothermal deflection detector for thin layer chromatography includes a translation means for holding and moving a thin layer chromatographic plate; a first impinging laser beam (e.g., 20 mW chopped argon laser) focused on the moveable thin layer chromatographic plate; a second probing laser beam (e.g., 2 mW He-Ne laser) intersecting the impinging laser beam directly above and parallel to the moveable thin layer chromatographic plate; and a laser deflection measuring means (e.g., knife edge, photodiode detector and lock-in amplifier demodulator) responsive to the thermal lens effect created by the absorption of the impinging laser beam by the separated compounds on the thin layer chromatographic plate. Such a system when applied to separated compounds (e.g., 1,2-napthaquinone, phenanthrenequinone and .alpha.-ionone) exhibits detection limits that range from 30 ng to 7.5 pg, depending upon the compounds's ability to absorb the impinging light.

REFERENCES:
patent: 4150899 (1979-04-01), Nakamura
patent: 4197012 (1980-04-01), Kerenyi et al.
patent: 4243327 (1981-01-01), Frosch et al.
patent: 4299494 (1981-11-01), Badoz et al.
patent: 4468136 (1984-08-01), Murphy et al.
"Laser-Based Ultrasensitive Spectroscopy and Detection V.", R. A. Keller (Editor) of Proceedings of SPIE, vol. 426, Aug. 23-24, 1983, pp. 116-120.
"A Sensitive Photothermal Deflection Technique for Measuring Absorption in Optically Thin Media", A. C. Bocara et al, Applied Physics & Laser Spectroscopy Gp, pp. 1-11, 4/1980.
IBM Technical Disclosure Bulletin, vol. 21, No. 10, 3/1979. "Trace Analysis in Gases-Technique", Hermann et al, pp. 4208-4209.
Solid State Technology/Mar. 1982, "Thermal Wave Microscopy", pp. 91-97 (A. Rosencwarg).

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