Photoresist polymer and photoresist composition containing...

Radiation imagery chemistry: process – composition – or product th – Imaged product – Including resin or synthetic polymer

Reexamination Certificate

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Details

C430S270100, C430S326000, C430S330000, C430S905000, C430S910000

Reexamination Certificate

active

11124762

ABSTRACT:
Photoresist polymers and photoresist compositions are disclosed. A photoresist polymer comprising a polymerization repeating unit represented by Formula I is less sensitive to change in the amount of energy due to its higher active energy than that of a conventional photoresist polymer. As a result, a phenomenon where the portion of the pattern for the storage electrode contact region that receives relatively large amount of light becomes too thin is avoided when the device isolation film pattern is formed, and wherein pattern collapse caused by a high aspect ratio due to high etching resistance is prevented or avoided.whereinR1–R10, a, b, c and d are as defined in the description.

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